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Pulse-to-pulse wavefront sensing at free-electron lasers using ptychography
The pressing need for knowledge of the detailed wavefront properties of ultra-bright and ultra-short pulses produced by free-electron lasers has spurred the development of several complementary characterization approaches. Here a method based on ptychography is presented that can retrieve high-resol...
Tallennettuna:
| Julkaisussa: | J Appl Crystallogr |
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| Päätekijät: | , , , , , , , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
International Union of Crystallography
2020
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7401787/ https://ncbi.nlm.nih.gov/pubmed/32788902 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720006913 |
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