APA Citation

Tran, T. T., Jablonka, L., Lavoie, C., Zhang, Z., & Primetzhofer, D. (2020). In-situ characterization of ultrathin nickel silicides using 3D medium-energy ion scattering. Sci Rep.

Citação norma Chicago

Tran, Tuan Thien, Lukas Jablonka, Christian Lavoie, Zhen Zhang, and Daniel Primetzhofer. "In-situ Characterization of Ultrathin Nickel Silicides Using 3D Medium-energy Ion Scattering." Sci Rep 2020.

MLA Citation

Tran, Tuan Thien, et al. "In-situ Characterization of Ultrathin Nickel Silicides Using 3D Medium-energy Ion Scattering." Sci Rep 2020.

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