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Effects of surface undulations on asymmetric X-ray diffraction: a rocking-curve topography study
The results are reported of an X-ray diffraction study of an Si crystal designed and fabricated for very asymmetric diffraction from the 333 reflection for X-ray energies of 8.100 and 8.200 keV. A crystal with an asymmetry angle of 46 ± 0.1° between the surface and the (111) planes was studied. The...
Shranjeno v:
| izdano v: | J Appl Crystallogr |
|---|---|
| Main Authors: | , , , , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
International Union of Crystallography
2020
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| Teme: | |
| Online dostop: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7312149/ https://ncbi.nlm.nih.gov/pubmed/32684893 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600576720005166 |
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