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Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review
Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews s...
Gardado en:
| Publicado en: | Polymers (Basel) |
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| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado: |
MDPI
2020
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| Assuntos: | |
| Acceso en liña: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7284686/ https://ncbi.nlm.nih.gov/pubmed/32429499 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/polym12051142 |
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