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Contemporary x-ray wavelength metrology and traceability
We report recent advances in absolute x-ray wavelength metrology in the context of producing modern standard reference data. Primary x-ray wavelength standards are produced today using diffraction spectrometers using crystal optics arranged to be operated in dispersive and non-dispersive geometries,...
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| Foilsithe in: | Radiat Phys Chem Oxf Engl 1993 |
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| Main Authors: | , , , , |
| Formáid: | Artigo |
| Teanga: | Inglês |
| Foilsithe: |
2019
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| Ábhair: | |
| Rochtain Ar Líne: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7266105/ https://ncbi.nlm.nih.gov/pubmed/32489233 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.radphyschem.2019.108392 |
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