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Electromigration-induced directional steps towards the formation of single atomic Ag contacts

Even though there have been many experimental attempts and theoretical approaches to understand the process of electromigration (EM), it has not been quantitatively understood for ultrathin structures and at grain boundaries. Nevertheless, we showed recently that it can be used reliably for the form...

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Detalhes bibliográficos
Publicado no:Beilstein J Nanotechnol
Main Authors: Chatterjee, Atasi, Tegenkamp, Christoph, Pfnür, Herbert
Formato: Artigo
Idioma:Inglês
Publicado em: Beilstein-Institut 2020
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7188988/
https://ncbi.nlm.nih.gov/pubmed/32395398
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.11.55
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