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Deep learning enables structured illumination microscopy with low light levels and enhanced speed
Structured illumination microscopy (SIM) surpasses the optical diffraction limit and offers a two-fold enhancement in resolution over diffraction limited microscopy. However, it requires both intense illumination and multiple acquisitions to produce a single high-resolution image. Using deep learnin...
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| Publicado en: | Nat Commun |
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| Autores principales: | , , , , , , , , |
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
Nature Publishing Group UK
2020
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7176720/ https://ncbi.nlm.nih.gov/pubmed/32321916 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-020-15784-x |
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