Prucnal, S., Żuk, J., Hübner, R., Duan, J., Wang, M., Pyszniak, K., . . . Zhou, S. (2020). Electron Concentration Limit in Ge Doped by Ion Implantation and Flash Lamp Annealing. Materials (Basel).
シカゴスタイル引用形Prucnal, Slawomir, Jerzy Żuk, René Hübner, Juanmei Duan, Mao Wang, Krzysztof Pyszniak, Andrzej Drozdziel, Marcin Turek, , Shengqiang Zhou. "Electron Concentration Limit in Ge Doped By Ion Implantation and Flash Lamp Annealing." Materials (Basel) 2020.
MLA引用形式Prucnal, Slawomir, et al. "Electron Concentration Limit in Ge Doped By Ion Implantation and Flash Lamp Annealing." Materials (Basel) 2020.
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