Cita APA

Lederer, M., Kämpfe, T., Vogel, N., Utess, D., Volkmann, B., Ali, T., . . . Eng, L. M. (2020). Structural and Electrical Comparison of Si and Zr Doped Hafnium Oxide Thin Films and Integrated FeFETs Utilizing Transmission Kikuchi Diffraction. Nanomaterials (Basel).

Citación estilo Chicago

Lederer, Maximilian, et al. "Structural and Electrical Comparison of Si and Zr Doped Hafnium Oxide Thin Films and Integrated FeFETs Utilizing Transmission Kikuchi Diffraction." Nanomaterials (Basel) 2020.

Cita MLA

Lederer, Maximilian, et al. "Structural and Electrical Comparison of Si and Zr Doped Hafnium Oxide Thin Films and Integrated FeFETs Utilizing Transmission Kikuchi Diffraction." Nanomaterials (Basel) 2020.