Rapid Recognition of Field-Grown Wheat Spikes Based on a Superpixel Segmentation Algorithm Using Digital Images

Wheat spike number, which could be rapidly and accurately estimated by the image processing technology, serves as the basis for crop growth monitoring and yield prediction. In this research, simple linear iterative clustering (SLIC) was performed for superpixel segmentation of the digital images of...

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Detalhes bibliográficos
Publicado no:Front Plant Sci
Main Authors: Tan, Changwei, Zhang, Pengpeng, Zhang, Yongjiang, Zhou, Xinxing, Wang, Zhixiang, Du, Ying, Mao, Wei, Li, Wenxi, Wang, Dunliang, Guo, Wenshan
Formato: Artigo
Idioma:Inglês
Publicado em: Frontiers Media S.A. 2020
Assuntos:
Plant Science
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7069027/
https://ncbi.nlm.nih.gov/pubmed/32211011
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3389/fpls.2020.00259
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