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Polarity Inversion of Aluminum Nitride Thin Films by using Si and MgSi Dopants

Polarity is among the critical characteristics that could governs the functionality of piezoelectric materials. In this study, the polarity of aluminum nitride (AlN) thin films was inverted from Al-polar to N-polar by doping Si into AlN in the range of 1–15 at.%. Polarity inversion from Al-polar to...

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Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Anggraini, Sri Ayu, Uehara, Masato, Hirata, Kenji, Yamada, Hiroshi, Akiyama, Morito
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2020
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Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC7062775/
https://ncbi.nlm.nih.gov/pubmed/32152367
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-020-61285-8
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