טוען...
Restoring drifted electron microscope volumes using synaptic vesicles at sub-pixel accuracy
Imaging ultrastructures in cells using Focused Ion Beam Scanning Electron Microscope (FIB-SEM) yields section-by-section images at nano-resolution. Unfortunately, we observe that FIB-SEM often introduces sub-pixel drifts between sections, in the order of 2.5 nm. The accumulation of these drifts sign...
שמור ב:
| הוצא לאור ב: | Commun Biol |
|---|---|
| Main Authors: | , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
Nature Publishing Group UK
2020
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7035423/ https://ncbi.nlm.nih.gov/pubmed/32081999 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s42003-020-0809-4 |
| תגים: |
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