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Restoring drifted electron microscope volumes using synaptic vesicles at sub-pixel accuracy

Imaging ultrastructures in cells using Focused Ion Beam Scanning Electron Microscope (FIB-SEM) yields section-by-section images at nano-resolution. Unfortunately, we observe that FIB-SEM often introduces sub-pixel drifts between sections, in the order of 2.5 nm. The accumulation of these drifts sign...

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書目詳細資料
發表在:Commun Biol
Main Authors: Stephensen, Hans Jacob Teglbjærg, Darkner, Sune, Sporring, Jon
格式: Artigo
語言:Inglês
出版: Nature Publishing Group UK 2020
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在線閱讀:https://ncbi.nlm.nih.gov/pmc/articles/PMC7035423/
https://ncbi.nlm.nih.gov/pubmed/32081999
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s42003-020-0809-4
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