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Deep Mutational Scan of an SCN5A Voltage Sensor
BACKGROUND –: Variants in ion channel genes have classically been studied in low-throughput by patch clamping. Deep Mutational Scanning (DMS) is a complementary approach that can simultaneously assess function of thousands of variants. METHODS –: We have developed and validated a method to perform a...
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| Publicado no: | Circ Genom Precis Med |
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| Main Authors: | , , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7031040/ https://ncbi.nlm.nih.gov/pubmed/31928070 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1161/CIRCGEN.119.002786 |
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