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Nanotip Contacts for Electric Transport and Field Emission Characterization of Ultrathin MoS(2) Flakes
We report a facile approach based on piezoelectric-driven nanotips inside a scanning electron microscope to contact and electrically characterize ultrathin MoS(2) (molybdenum disulfide) flakes on a SiO(2)/Si (silicon dioxide/silicon) substrate. We apply such a method to analyze the electric transpor...
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| Publicado no: | Nanomaterials (Basel) |
|---|---|
| Main Authors: | , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2020
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC7023401/ https://ncbi.nlm.nih.gov/pubmed/31947985 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano10010106 |
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