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Optical properties of Ar ions irradiated nanocrystalline ZrC and ZrN thin films
Thin nanocrystalline ZrC and ZrN films (<400 nm), grown on (100) Si substrates at a substrate temperature of 500 °C by the pulsed laser deposition (PLD) technique, were irradiated by 800 keV Ar ion irradiation with fluences from 1 × 10(14) at/cm(2) up to 2 × 10(15) at/cm(2). Optical reflectance d...
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| Izdano u: | J Nucl Mater |
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| Glavni autori: | , , , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
2017
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| Teme: | |
| Online pristup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6999656/ https://ncbi.nlm.nih.gov/pubmed/32020950 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.jnucmat.2017.02.041 |
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