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Electric field-induced crossover from 3D to 2D topological defects in a nematic liquid crystal: Experimental verification
A substrate was patterned with two pairs of half-integer strength topological defects, (+½, +½) and (+½, −½). In a sufficiently thick cell, a disclination line runs in an arch above the substrate connecting the two half integer defects within each pair. The director around the disclination line for...
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| Publicat a: | Soft Matter |
|---|---|
| Autors principals: | , , , , |
| Format: | Artigo |
| Idioma: | Inglês |
| Publicat: |
2020
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| Matèries: | |
| Accés en línia: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6981022/ https://ncbi.nlm.nih.gov/pubmed/31693053 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1039/c9sm01733j |
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