Yüklüyor......
Advanced Surface Probing Using a Dual-Mode NSOM–AFM Silicon-Based Photosensor
A feasibility analysis is performed for the development and integration of a near-field scanning optical microscope (NSOM) tip–photodetector operating in the visible wavelength domain of an atomic force microscope (AFM) cantilever, involving simulation, processing, and measurement. The new tip–photo...
Kaydedildi:
| Yayımlandı: | Nanomaterials (Basel) |
|---|---|
| Asıl Yazarlar: | , , , , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
MDPI
2019
|
| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6956262/ https://ncbi.nlm.nih.gov/pubmed/31888260 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano9121792 |
| Etiketler: |
Etiketle
Etiket eklenmemiş, İlk siz ekleyin!
|