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Mobility of charge carriers in self-assembled monolayers
We present a new approach to study charge transport within 2D layers of organic semi-conductors (OSCs) using atomic force microscopy (AFM)-based lithography applied to self-assembled monolayers (SAMs), fabricated from appropriate organothiols. The extent of lateral charge transport was investigated...
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| 出版年: | Beilstein J Nanotechnol |
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| 主要な著者: | , , , , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
Beilstein-Institut
2019
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6941449/ https://ncbi.nlm.nih.gov/pubmed/31921523 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3762/bjnano.10.235 |
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