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Full-field spectroscopic measurement of the X-ray beam from a multilayer monochromator using a hyperspectral X-ray camera

Multilayer monochromator devices are commonly used at (imaging) beamlines of synchrotron facilities to shape the X-ray beam to relatively small bandwidth and high intensity. However, stripe artefacts are often observed and can deteriorate the image quality. Although the intensity distribution of the...

पूर्ण विवरण

में बचाया:
ग्रंथसूची विवरण
में प्रकाशित:J Synchrotron Radiat
मुख्य लेखकों: Boone, Matthieu N., Van Assche, Frederic, Vanheule, Sander, Cipiccia, Silvia, Wang, Hongchang, Vincze, Laszlo, Van Hoorebeke, Luc
स्वरूप: Artigo
भाषा:Inglês
प्रकाशित: International Union of Crystallography 2020
विषय:
ऑनलाइन पहुंच:https://ncbi.nlm.nih.gov/pmc/articles/PMC6927514/
https://ncbi.nlm.nih.gov/pubmed/31868743
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577519015212
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