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Amorphous Ge-Bi-Se Thin Films: A Mass Spectrometric Study
The Ge-Bi-Se thin films of varied compositions (Ge content 0–32.1 at. %, Bi content 0–45.7 at. %, Se content 54.3–67.9 at. %) have been prepared by rf magnetron (co)-sputtering technique. The present study was undertaken in order to investigate the clusters generated during the interaction of laser...
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| Publicado en: | Sci Rep |
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| Autores principales: | , , , , , , , |
| Formato: | Artigo |
| Lenguaje: | Inglês |
| Publicado: |
Nature Publishing Group UK
2019
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| Materias: | |
| Acceso en línea: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6915747/ https://ncbi.nlm.nih.gov/pubmed/31844112 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-55773-9 |
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