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Controlled Plasma Thinning of Bulk MoS(2) Flakes for Photodetector Fabrication
[Image: see text] The electronic properties of layered materials are directly determined based on their thicknesses. Remarkable progress has been carried out on synthesis of wafer-scale atomically molybdenum disulfide (MoS(2)) layers as a two-dimensional material in the past few years in order to tr...
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| Vydáno v: | ACS Omega |
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| Hlavní autoři: | , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
American Chemical Society
2019
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| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6881830/ https://ncbi.nlm.nih.gov/pubmed/31788600 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsomega.9b02367 |
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