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Predicting strength distributions of MEMS structures using flaw size and spatial density

The populations of flaws in individual layers of microelectromechanical systems (MEMS) structures are determined and verified using a combination of specialized specimen geometry, recent probabilistic analysis, and topographic mapping. Strength distributions of notched and tensile bar specimens are...

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Bibliografski detalji
Izdano u:Microsyst Nanoeng
Glavni autori: Cook, Robert F., DelRio, Frank W., Boyce, Brad L.
Format: Artigo
Jezik:Inglês
Izdano: Nature Publishing Group UK 2019
Teme:
Online pristup:https://ncbi.nlm.nih.gov/pmc/articles/PMC6826048/
https://ncbi.nlm.nih.gov/pubmed/31700670
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41378-019-0093-y
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