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A Sensitive and Versatile Thickness Determination Method Based on Non-Inflection Terahertz Property Fitting
The accuracy of thin-film characterization in terahertz spectroscopy is mainly set by the thickness uncertainty. Physical thickness measurement has limited accuracy for thin-film samples thinner than a few hundreds of micrometers and is sometimes even impossible. The temporal resolution of time-doma...
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| Publicado no: | Sensors (Basel) |
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| Main Authors: | , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6806189/ https://ncbi.nlm.nih.gov/pubmed/31547626 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s19194118 |
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