Yüklüyor......
Reflection Correction for High-Accuracy Transmittance Measurements on Filter Glasses
Multiple reflections in the sample compartment of a spectrophotometer constitute a source of systematic bias in transmittance measurements on filter glasses. This bias may be removed by applying a numerical correction obtained from measurements on tilted samples in polarized light. For a high-accura...
Kaydedildi:
| Yayımlandı: | J Res Natl Bur Stand A Phys Chem |
|---|---|
| Asıl Yazarlar: | , |
| Materyal Türü: | Artigo |
| Dil: | Inglês |
| Baskı/Yayın Bilgisi: |
National Institute of Standards and Technology
1973
|
| Konular: | |
| Online Erişim: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6728497/ https://ncbi.nlm.nih.gov/pubmed/32189763 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.077A.041 |
| Etiketler: |
Etiketle
Etiket eklenmemiş, İlk siz ekleyin!
|