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Reflection Correction for High-Accuracy Transmittance Measurements on Filter Glasses
Multiple reflections in the sample compartment of a spectrophotometer constitute a source of systematic bias in transmittance measurements on filter glasses. This bias may be removed by applying a numerical correction obtained from measurements on tilted samples in polarized light. For a high-accura...
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| Gepubliceerd in: | J Res Natl Bur Stand A Phys Chem |
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| Hoofdauteurs: | , |
| Formaat: | Artigo |
| Taal: | Inglês |
| Gepubliceerd in: |
National Institute of Standards and Technology
1973
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| Onderwerpen: | |
| Online toegang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6728497/ https://ncbi.nlm.nih.gov/pubmed/32189763 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.077A.041 |
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