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Reflection Correction for High-Accuracy Transmittance Measurements on Filter Glasses

Multiple reflections in the sample compartment of a spectrophotometer constitute a source of systematic bias in transmittance measurements on filter glasses. This bias may be removed by applying a numerical correction obtained from measurements on tilted samples in polarized light. For a high-accura...

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Detalhes bibliográficos
Publicado no:J Res Natl Bur Stand A Phys Chem
Main Authors: Mielenz, K. D., Mavrodineanu, R.
Formato: Artigo
Idioma:Inglês
Publicado em: National Institute of Standards and Technology 1973
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6728497/
https://ncbi.nlm.nih.gov/pubmed/32189763
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.077A.041
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