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Few-cycle Regime Atomic Force Microscopy
Traditionally, dynamic atomic force microscopy (AFM) techniques are based on the analysis of the quasi-steady state response of the cantilever deflection in terms of Fourier analysis. Here we describe a technique that instead exploits the often disregarded transient response of the cantilever throug...
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| Udgivet i: | Sci Rep |
|---|---|
| Main Authors: | , , , , |
| Format: | Artigo |
| Sprog: | Inglês |
| Udgivet: |
Nature Publishing Group UK
2019
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| Fag: | |
| Online adgang: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6722071/ https://ncbi.nlm.nih.gov/pubmed/31481670 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-49104-1 |
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