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Is radiation damage the limiting factor in high-resolution single particle imaging with X-ray free-electron lasers?
The prospect of single particle imaging with atomic resolution is one of the scientific drivers for the development of X-ray free-electron lasers. The assumption since the beginning has been that damage to the sample caused by intense X-ray pulses is one of the limiting factors for achieving subnano...
Tallennettuna:
| Julkaisussa: | Struct Dyn |
|---|---|
| Päätekijät: | , , , |
| Aineistotyyppi: | Artigo |
| Kieli: | Inglês |
| Julkaistu: |
American Crystallographic Association
2019
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| Aiheet: | |
| Linkit: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6701976/ https://ncbi.nlm.nih.gov/pubmed/31463335 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.5098309 |
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