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Is radiation damage the limiting factor in high-resolution single particle imaging with X-ray free-electron lasers?

The prospect of single particle imaging with atomic resolution is one of the scientific drivers for the development of X-ray free-electron lasers. The assumption since the beginning has been that damage to the sample caused by intense X-ray pulses is one of the limiting factors for achieving subnano...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Julkaisussa:Struct Dyn
Päätekijät: Östlin, C., Timneanu, N., Caleman, C., Martin, A. V.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: American Crystallographic Association 2019
Aiheet:
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC6701976/
https://ncbi.nlm.nih.gov/pubmed/31463335
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.5098309
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