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Fast and robust phase-shift estimation in two-dimensional structured illumination microscopy
A method of determining unknown phase-shifts between elementary images in two-dimensional Structured Illumination Microscopy (2D-SIM) is presented. The proposed method is based on the comparison of the peak intensity of spectral components. These components correspond to the inherent structured illu...
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| Publicado no: | PLoS One |
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| Main Authors: | , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Public Library of Science
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6697343/ https://ncbi.nlm.nih.gov/pubmed/31419247 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1371/journal.pone.0221254 |
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