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Electronic Densities of States from X-Ray Photoelectron Spectroscopy
In x-ray photoelectron spectroscopy (XPS), a sample is exposed to low energy x rays (approximately 1 keV), and the resultant photoelectrons are analyzed with high precision for kinetic energy. After correction for inelastic scattering, the measured photoelectron spectrum should reflect the valence b...
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| Pubblicato in: | J Res Natl Bur Stand A Phys Chem |
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| Autori principali: | , |
| Natura: | Artigo |
| Lingua: | Inglês |
| Pubblicazione: |
National Institute of Standards and Technology
1970
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| Soggetti: | |
| Accesso online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6696543/ https://ncbi.nlm.nih.gov/pubmed/32523208 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.074A.045 |
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