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Logistic Regression for Machine Learning in Process Tomography
The main goal of the research presented in this paper was to develop a refined machine learning algorithm for industrial tomography applications. The article presents algorithms based on logistic regression in relation to image reconstruction using electrical impedance tomography (EIT) and ultrasoun...
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| Publicado no: | Sensors (Basel) |
|---|---|
| Principais autores: | , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
MDPI
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6696525/ https://ncbi.nlm.nih.gov/pubmed/31382513 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/s19153400 |
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