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Nanoscale Intelligent Imaging Based on Real-Time Analysis of Approach Curve by Scanning Electrochemical Microscopy

Scanning electrochemical microscopy (SECM) enables high-resolution imaging by examining the amperometric response of an ultramicroelectrode tip near a substrate. Spatial resolution, however, is compromised for non-flat substrates, where distances from a tip far exceed the tip size to avoid artifacts...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Veröffentlicht in:Anal Chem
Hauptverfasser: Balla, Ryan J., Jantz, Dylan T., Kurapati, Niraja, Chen, Ran, Leonard, Kevin C., Amemiya, Shigeru
Format: Artigo
Sprache:Inglês
Veröffentlicht: 2019
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC6685738/
https://ncbi.nlm.nih.gov/pubmed/31310104
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.analchem.9b02361
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