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Microwave Permittivity of Trace sp(2) Carbon Impurities in Sub-Micron Diamond Powders
[Image: see text] Microwave dielectric loss tangent measurements are demonstrated as a method for quantifying trace sp(2)-hybridized carbon impurities in sub-micron diamond powders. Appropriate test samples are prepared by vacuum annealing at temperatures from 600 to 1200 °C to vary the sp(2)/sp(3)...
Shranjeno v:
| izdano v: | ACS Omega |
|---|---|
| Main Authors: | , , , , , , , |
| Format: | Artigo |
| Jezik: | Inglês |
| Izdano: |
American Chemical Society
2018
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| Online dostop: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6641517/ https://ncbi.nlm.nih.gov/pubmed/31458523 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acsomega.7b02000 |
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