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Optical nonlinearities in ultra-silicon-rich nitride characterized using z-scan measurements

The dispersive nonlinear refractive index of ultra-silicon-rich nitride, and its two-photon and three-photon absorption coefficients are measured in the wavelength range between 0.8 µm–1.6 µm, covering the O- to L – telecommunications bands. In the two-photon absorption range, the measured nonlinear...

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Detalhes bibliográficos
Publicado no:Sci Rep
Main Authors: Sohn, Byoung-Uk, Choi, Ju Won, Ng, Doris K. T., Tan, Dawn T. H.
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2019
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Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6637241/
https://ncbi.nlm.nih.gov/pubmed/31316096
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-46865-7
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