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Verification of Charge Transfer in Metal-Insulator-Oxide Semiconductor Diodes via Defect Engineering of Insulator

In a MIS (Metal/Insulator/Semiconductor) structure consisting of two terminals, a systematic analysis of the electrical charge transport mechanism through an insulator is essential for advanced electronic application devices such as next-generation memories based on resistance differences. Herein, w...

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Podrobná bibliografie
Vydáno v:Sci Rep
Hlavní autoři: Lee, Donggun, Park, Jun-Woo, Cho, Nam-Kwang, Lee, Jinwon, Kim, Youn Sang
Médium: Artigo
Jazyk:Inglês
Vydáno: Nature Publishing Group UK 2019
Témata:
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC6635483/
https://ncbi.nlm.nih.gov/pubmed/31312002
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-46752-1
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