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Focus characterization of the NanoMAX Kirkpatrick–Baez mirror system
The focusing and coherence properties of the NanoMAX Kirkpatrick–Baez mirror system at the fourth-generation MAX IV synchrotron in Lund have been characterized. The direct measurement of nano-focused X-ray beams is possible by scanning of an X-ray waveguide, serving basically as an ultra-thin slit....
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| Publicado no: | J Synchrotron Radiat |
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| Main Authors: | , , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
International Union of Crystallography
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6613126/ https://ncbi.nlm.nih.gov/pubmed/31274441 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577519003886 |
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