APA Citatie

Hu, B., Ochoa, E. D., Sanchez, D., Perron, J. K., Zimmerman, N. M., & Stewart, M. D. (2018). Effect of device design on charge offset drift in Si/SiO(2) single electron devices. J Appl Phys.

Chicago Style citaat

Hu, Binhui, Erick D. Ochoa, Daniel Sanchez, Justin K. Perron, Neil M. Zimmerman, en M. D. Stewart. "Effect of Device Design On Charge Offset Drift in Si/SiO(2) Single Electron Devices." J Appl Phys 2018.

MLA citatie

Hu, Binhui, et al. "Effect of Device Design On Charge Offset Drift in Si/SiO(2) Single Electron Devices." J Appl Phys 2018.