एपीए उद्धरण

Hu, B., Ochoa, E. D., Sanchez, D., Perron, J. K., Zimmerman, N. M., & Stewart, M. D. (2018). Effect of device design on charge offset drift in Si/SiO(2) single electron devices. J Appl Phys.

शिकागो स्टाइल उद्धरण

Hu, Binhui, Erick D. Ochoa, Daniel Sanchez, Justin K. Perron, Neil M. Zimmerman, और M. D. Stewart. "Effect of Device Design On Charge Offset Drift in Si/SiO(2) Single Electron Devices." J Appl Phys 2018.

एमएलए उद्धरण

Hu, Binhui, et al. "Effect of Device Design On Charge Offset Drift in Si/SiO(2) Single Electron Devices." J Appl Phys 2018.