Identification of Loci and Candidate Genes Responsible for Pod Dehiscence in Soybean via Genome-Wide Association Analysis Across Multiple Environments

Pod dehiscence (shattering) is the main cause of serious yield loss during the soybean mechanical harvesting process. A better understanding of the genetic architecture and molecular mechanisms of pod dehiscence is of great significance for soybean breeding. In this study, genome-wide association an...

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Vydáno v:Front Plant Sci
Hlavní autoři: Hu, Dezhou, Kan, Guizhen, Hu, Wei, Li, Yali, Hao, Derong, Li, Xiao, Yang, Hui, Yang, Zhongyi, He, Xiaohong, Huang, Fang, Yu, Deyue
Médium: Artigo
Jazyk:Inglês
Vydáno: Frontiers Media S.A. 2019
Témata:
Plant Science
On-line přístup:https://ncbi.nlm.nih.gov/pmc/articles/PMC6598122/
https://ncbi.nlm.nih.gov/pubmed/31293609
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3389/fpls.2019.00811
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