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A 3-D Projection Model for X-ray Dark-field Imaging
The X-ray dark-field signal can be measured with a grating-based Talbot-Lau interferometer. It measures small angle scattering of micrometer-sized oriented structures. Interestingly, the signal is a function not only of the material, but also of the relative orientation of the sample, the X-ray beam...
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| Publicado no: | Sci Rep |
|---|---|
| Main Authors: | , , , , , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
Nature Publishing Group UK
2019
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6592954/ https://ncbi.nlm.nih.gov/pubmed/31239499 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-45708-9 |
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