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Optical Properties of Thin Films on Transparent Surfaces by Ellipsometry; Internal Reflection for Film Covered Surfaces Near the Critical Angle
The application of ellipsometry to the determination of the optical properties of thin films on transparent substrates by the use of internal reflection and angles of incidence near the critical angle for total reflection is described and illustrated. Four cases are considered: 1. the angle of incid...
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| 出版年: | J Res Natl Bur Stand A Phys Chem |
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| 主要な著者: | , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
National Institute of Standards and Technology
1964
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6592382/ https://ncbi.nlm.nih.gov/pubmed/31834744 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.6028/jres.068A.058 |
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