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No-Reference Quality Assessment Method for Blurriness of SEM Micrographs with Multiple Texture
Scanning electron microscopy (SEM) plays an important role in the intuitive understanding of microstructures because it can provide ultrahigh magnification. Tens or hundreds of images are regularly generated and saved during a typical microscopy imaging process. Given the subjectivity of a microscop...
Αποθηκεύτηκε σε:
| Τόπος έκδοσης: | Scanning |
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| Κύριοι συγγραφείς: | , , , , |
| Μορφή: | Artigo |
| Γλώσσα: | Inglês |
| Έκδοση: |
Hindawi
2019
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| Θέματα: | |
| Διαθέσιμο Online: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6589194/ https://ncbi.nlm.nih.gov/pubmed/31281563 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1155/2019/4271761 |
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