טוען...
Elemental Distribution and Structural Characterization of GaN/InGaN Core-Shell Single Nanowires by Hard X-ray Synchrotron Nanoprobes
Improvements in the spatial resolution of synchrotron-based X-ray probes have reached the nano-scale and they, nowadays, constitute a powerful platform for the study of semiconductor nanostructures and nanodevices that provides high sensitivity without destroying the material. Three complementary ha...
שמור ב:
| הוצא לאור ב: | Nanomaterials (Basel) |
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| Main Authors: | , , , , , , , , , , |
| פורמט: | Artigo |
| שפה: | Inglês |
| יצא לאור: |
MDPI
2019
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| נושאים: | |
| גישה מקוונת: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6566811/ https://ncbi.nlm.nih.gov/pubmed/31058842 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.3390/nano9050691 |
| תגים: |
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