Novel TEM Microscopy and Electron Diffraction Techniques to Characterize Cultural Heritage Materials: From Ancient Greek Artefacts to Maya Mural Paintings

To understand in-depth material properties, manufacturing, and conservation in cultural heritage artefacts, there is a strong need for advanced characterization tools that enable analysis down to the nanometric scale. Transmission electron microscopy (TEM) and electron diffraction (ED) techniques, l...

Täydet tiedot

Tallennettuna:
Bibliografiset tiedot
Julkaisussa:Scanning
Päätekijät: Nicolopoulos, Stavros, Das, Partha P., Pérez, Alejandro Gómez, Zacharias, Nikolaos, Cuapa, Samuel Tehuacanero, Alatorre, Jesús Angel Arenas, Mugnaioli, Enrico, Gemmi, Mauro, Rauch, Edgar F.
Aineistotyyppi: Artigo
Kieli:Inglês
Julkaistu: Hindawi 2019
Aiheet:
Research Article
Linkit:https://ncbi.nlm.nih.gov/pmc/articles/PMC6556332/
https://ncbi.nlm.nih.gov/pubmed/31263516
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1155/2019/4870695
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