Li, J., Liu, Y., Han, G., Zhou, J., & Hao, Y. (2019). Comparative Study of Negative Capacitance Field-Effect Transistors with Different MOS Capacitances. Nanoscale Res Lett.
Citação norma ChicagoLi, Jing, Yan Liu, Genquan Han, Jiuren Zhou, and Yue Hao. "Comparative Study of Negative Capacitance Field-Effect Transistors With Different MOS Capacitances." Nanoscale Res Lett 2019.
Deismireacht MLALi, Jing, et al. "Comparative Study of Negative Capacitance Field-Effect Transistors With Different MOS Capacitances." Nanoscale Res Lett 2019.
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