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Native mass spectrometry provides sufficient ion flux for XFEL single-particle imaging
The SPB/SFX instrument at the European XFEL provides unique conditions for single-particle imaging (SPI) experiments due to its high brilliance, nano-focus and unique pulse structure. Promising initial results provided by the international LCLS (Linac Coherent Light Source) SPI initiative highlight...
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| 出版年: | J Synchrotron Radiat |
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| 主要な著者: | , , , , , , |
| フォーマット: | Artigo |
| 言語: | Inglês |
| 出版事項: |
International Union of Crystallography
2019
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| 主題: | |
| オンライン･アクセス: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6510201/ https://ncbi.nlm.nih.gov/pubmed/31074428 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1107/S1600577519002686 |
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