Experimental steering of electron microscopy studies using prior X-ray computed tomography

Transmission electron microscopy (TEM) and scanning electron microscopy (SEM) can provide unrivalled high-resolution images of specific features and volumes of interest. However, the regions interrogated are typically very small, and sample preparation is both time-consuming and destructive. Here we...

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Detalhes bibliográficos
Publicado no:Ultramicroscopy
Main Authors: Starborg, Tobias, O'Sullivan, James D.B., Carneiro, Claudia Martins, Behnsen, Julia, Else, Kathryn J., Grencis, Richard K., Withers, Philip J.
Formato: Artigo
Idioma:Inglês
Publicado em: Elsevier 2019
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Article
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6504073/
https://ncbi.nlm.nih.gov/pubmed/30928781
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2019.03.002
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