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Mapping Electron Transfer at MoS(2) using Scanning Electrochemical Microscopy
Understanding the role of macroscopic and atomic defects in the interfacial electron transfer properties of layered transition metal dichalcogenides is important in optimizing their performance in energy conversion and electronic devices. Means of determining the heterogeneous electron transfer rate...
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| Publicado no: | Langmuir |
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| Main Authors: | , , |
| Formato: | Artigo |
| Idioma: | Inglês |
| Publicado em: |
2018
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| Assuntos: | |
| Acesso em linha: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6501596/ https://ncbi.nlm.nih.gov/pubmed/30372618 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1021/acs.langmuir.8b02731 |
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