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The energy dependence of contrast and damage in electron cryomicroscopy of biological molecules

We have measured the dependence on electron energy of elastic and inelastic scattering cross-sections from carbon, over the energy range that includes 100 keV to 300 keV. We also compared quantitatively the radiation damage to bacteriorhodopsin and paraffin (C(44)H(90)) at 100 keV and 300 keV by obs...

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Détails bibliographiques
Publié dans:Ultramicroscopy
Auteurs principaux: Peet, Mathew J., Henderson, Richard, Russo, Christopher J.
Format: Artigo
Langue:Inglês
Publié: Elsevier 2019
Sujets:
Accès en ligne:https://ncbi.nlm.nih.gov/pmc/articles/PMC6495108/
https://ncbi.nlm.nih.gov/pubmed/30773415
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1016/j.ultramic.2019.02.007
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