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X-ray spectrometer having 12 000 resolving power at 8 keV energy

An x-ray spectrometer employing a thin (50 μm) silicon transmission crystal was used to record high-resolution Cu Kα spectra from a laboratory x-ray source. The diffraction was from the (331) planes that were at an angle of 13.26° to the crystal surface. The components of the spectral lines resultin...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Veröffentlicht in:Rev Sci Instrum
Hauptverfasser: Seely, John F., Hudson, Lawrence T., Henins, Albert, Feldman, Uri
Format: Artigo
Sprache:Inglês
Veröffentlicht: 2017
Schlagworte:
Online Zugang:https://ncbi.nlm.nih.gov/pmc/articles/PMC6467280/
https://ncbi.nlm.nih.gov/pubmed/29092530
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1063/1.4999995
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