APA aipamena

McCrory, D. J., Anders, M. A., Ryan, J. T., Shrestha, P. R., Cheung, K. P., Lenahan, P. M., & Campbell, J. P. (2018). Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station. IEEE Trans Device Mater Reliab.

Chicago Style aipamena

McCrory, Duane J., Mark A. Anders, Jason T. Ryan, Pragya R. Shrestha, Kin P. Cheung, Patrick M. Lenahan, and Jason P. Campbell. "Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station." IEEE Trans Device Mater Reliab 2018.

MLA aipamena

McCrory, Duane J., et al. "Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station." IEEE Trans Device Mater Reliab 2018.