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Ultra-high resolution imaging of thin films and single strands of polythiophene using atomic force microscopy

Real-space images of polymers with sub-molecular resolution could provide valuable insights into the relationship between morphology and functionality of polymer optoelectronic devices, but their acquisition is problematic due to perceived limitations in atomic force microscopy (AFM). We show that i...

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Detalhes bibliográficos
Publicado no:Nat Commun
Main Authors: Korolkov, Vladimir V., Summerfield, Alex, Murphy, Alanna, Amabilino, David B., Watanabe, Kenji, Taniguchi, Takashi, Beton, Peter H.
Formato: Artigo
Idioma:Inglês
Publicado em: Nature Publishing Group UK 2019
Assuntos:
Acesso em linha:https://ncbi.nlm.nih.gov/pmc/articles/PMC6449331/
https://ncbi.nlm.nih.gov/pubmed/30948725
https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41467-019-09571-6
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