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Bulk and surface recombination properties in thin film semiconductors with different surface treatments from time-resolved photoluminescence measurements
The knowledge of minority carrier lifetime of a semiconductor is important for the assessment of its quality and design of electronic devices. Time-resolved photoluminescence (TRPL) measurements offer the possibility to extract effective lifetimes in the nanosecond range. However, it is difficult to...
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| Vydáno v: | Sci Rep |
|---|---|
| Hlavní autoři: | , , , , , |
| Médium: | Artigo |
| Jazyk: | Inglês |
| Vydáno: |
Nature Publishing Group UK
2019
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| Témata: | |
| On-line přístup: | https://ncbi.nlm.nih.gov/pmc/articles/PMC6440953/ https://ncbi.nlm.nih.gov/pubmed/30926885 https://ncbi.nlm.nih.govhttp://dx.doi.org/10.1038/s41598-019-41716-x |
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